Contact Us

F-theta Lenses

  • Introduction


F-Theta Scanning Lenses


The F-Theta scanning lenses are commonly used in laser scanning systems that employ two-axis galvanometers to scan a specified area but cannot tolerate the angle at the image plane. By introducing a specified amount of barrel distortion in a scanning lens, the F-Theta scanning lens becomes an ideal choice for applications that require a flat field on the image plane such as laser scanning, marking, engraving and cutting systems. Depending on the requirements of the application, these diffraction limited lens systems can be optimized to account for wavelength, spot size, and focal length, and distortion is held to less than 0.25% throughout the field of view of the lens.


SL-Q Series F-Theta Scan Lenses to custom

Hyperion Optics Off-the-shelf F-Theta Lenses:





Part No. Scan Field Input Beam Focus Spot Max. Scan Angle Thread M1-M2 WD Window
EFL (mm)
Ф(1/e2) Ф(1/e2) (±deg) (mm) (mm) Dia×Thk
(mm) (mm) (μm) (mm)
HYP-1064-50-100Q 100 50x50 15 13 21.3 M85x1 25.6 131 94x2.5
HYP-1064-94-163Q 163 94x94 20 23 24.7 M85x1 26 204.8 138x2.5
HYP-1064-112-163Q 163 112x112 10 30 25 M85x1 12.5 203.7 120x2.5
HYP-1064-170-255Q-D20 255 170x170 20 24 28 M85x1 25.8 319.4 150x3
HYP-1064-142-277Q 277 142x142 15 32.5 21 M85x1 26 347.5 96x2.5
HYP-1064-215-340Q-D20 340 215x215 20 32 25 M85x1 27 203.8 140x3.5
HYP-1064-220-460Q-D30 460 220x220 30 44 25 M98x1 43 572.4 144x4
HYP-1064-280-420Q 420 280x280 14 60.7 27 M85x1 17 506.3 112x2.5
HYP-1064-320-450Q 450 320x320 14 45 25 M85x1 15 515.9 104x3.9
HYP-1064-280-500Q-D30 500 280x280 30 34 22.9 M85x1 37 618.3 180x3.5
HYP-1064-340-500Q-D20 500 340x340 20 14.5 26.8 M85x1 26 569.8 140x3.5
HYP-1064-350-640Q 640 350x350 10 95.7 23.6 M85x1 16 706.9 73x2.5
HYP-1064-425-875Q-D20 875 425x425 20 93.2 19.3 M85x1 26 975.2 83x2.5
Part No. Scan Field Input Beam Focus Spot Max. Scan Angle Thread M1-M2 WD Window
EFL (mm)
Ф(1/e2) Ф(1/e2) (±deg) (mm) (mm) Dia×Thk
(mm) (mm) (μm) (mm)
HYP-980-160-260Q-D20 260 160x160 20 30 23 M85x1 27 130 138x2.5
HYP-980-215-335Q-D20 335 215x215 20 35 24 M85x1 27 200 140x3.5
HYP-980-280-420Q 418.5 280x280 14 56.1 27.1 M85x1 17 497.3 112x2.5
HYP-980-400-640Q-D20 640 400x400 20 64 24.5 M85x1 27 556 128x3.5
HYP-980-450-650Q-D30 650.0 450x450 30 103 25 M123x1 37 784.9 220x5
Part No. Scan Field Input Beam Focus Spot Max. Scan Angle Thread M1-M2 WD Window
EFL (mm)
Ф(1/e2) Ф(1/e2) (±deg) (mm) (mm) Dia×Thk
(mm) (mm) (μm) (mm)
HYP-1940-635-60-163 163 60x60 14 29 25 M85x1 18 128.2 68x2.5
Part No. Scan Field Input Beam Focus Spot Max. Scan Angle Thread M1-M2 WD Window
EFL (mm)
Ф(1/e2) Ф(1/e2) (±deg) (mm) (mm) Dia×Thk
(mm) (mm) (μm) (mm)
HYP-1064-635-100-163 163 100x100 12 22.5 25.5 M85x1 20 157.6 85x2
HYP-1064-635-180-260 260 180x180 15 28 28.3 M85x1 20 261.4 123x3
HYP-1064-630-150-254B 254 150x150 30 110 25 M102X1 43 306.9 128x4
HYP-1064-532-100-163 163 100x100 12 21 25 M85x1 14 159.7 84x2
HYP-1064-532-175-254 254 175x175 15 25 28 M85x1 16 262.8 120x3
Part No. Scan Field Input Beam Focus Spot Max. Scan Angle Thread M1-M2 WD Window
EFL (mm)
Ф(1/e2) Ф(1/e2) (±deg) (mm) (mm) Dia×Thk
(mm) (mm) (μm) (mm)
HYP-532-635-100-163 163 100x100 10 12.4 24.8 M85x1 13 121 97x2.5
Part No. Scan Field Input Beam Focus Spot Max. Scan Angle Thread M1-M2 WD Window
EFL (mm)
Ф(1/e2) Ф(1/e2) (±deg) (mm) (mm) Dia×Thk
(mm) (mm) (μm) (mm)
HYP-1030-950-200-400 400 200x200 30 26.4 20 M85x1 36 390.2 120x3.5
Part No. Scan Field Input Beam Focus Spot Max. Scan Angle Thread M1-M2 WD Window
EFL (mm)
Ф(1/e2) Ф(1/e2) (±deg) (mm) (mm) Dia×Thk
(mm) (mm) (μm) (mm)
HYP-355-635-90-170 170 90x90 10 14 21.5 M85x1 20 116.1 95x2.5
HYP-355-635-110-220 220 110x110 10 11.5 20.2 M85x1 13 166.3 90x3
HYP-355-635-212-328 328 212x212 6 45 17.9 M85x1 13 265.2 104x3
Part No. Scan Field Input Beam Focus Spot Max. Scan Angle Thread M1-M2 WD Window
EFL (mm)
Ф(1/e2) Ф(1/e2) (±deg) (mm) (mm) Dia×Thk
(mm) (mm) (μm) (mm)
HYP-355-532-90-170 170 90x90 10 13.1 21.5 M85x1 20 125.6 95x2.5
Part No. Scan Field Input Beam Focus Spot Max. Scan Angle Thread M1-M2 WD Window
EFL (mm)
Ф(1/e2) Ф(1/e2) (±deg) (mm) (mm) Dia×Thk
(mm) (mm) (μm) (mm)
HYP-355-405-110-178 178 110x110 10 15 24.7 M85x1 13 92.4 106x3




In addition to these standard designs, we can develop complete systems for you, use components from laser beam shaping to the expansion and splitting of laser beams. 




Details

F-theta Lenses can shoot and form the image of objects of limited distance. It provides full glass high-performance lens, and different lenses meet the functions of A3, A4, barcode scanning. It is applied to the flatbed scanner and high shot instrument equipment. The lens is close to the diffraction limit and has small distortion, which meets the requirements of use.

The principles of F-theta Lenses:

To change the directions of beams through moving the scanner. To make the movement become the one of the focus on the focal plane by focus lens’s focusing. Laser scanning can be divided into pre-objective scanning and scanning after the objective lens. Usually scanning device with the high requirement is pre—objective scanning.

The special characteristics of scanning objective:

1. Scanning objective belongs to the imaging difference system with a small aperture, which requires rather high optical resolution.

2.Because of a photoelectric device, it should not only adjust the aberration of white light (mixed light), but consider aberrations of three independent wavelengths of R, G and B.

3. To correct the distortion aberration.

Related Content

  • Miniature Lenses

    Miniature Lenses

    February 17, 2017With the rapid growing market of consumer electronics and mobile phones, miniature cameras performance is becoming more challenging compared to years ago. However, manufacturing cost, packaging, imagi...view
  • F-theta Lenses

    F-theta Lenses

    February 17, 2017Don’t have a complete design? No problem!F-Theta Scanning Lenses are commonly used in laser marking, engraving, and cutting systems. Used in conjunction with a galvanometer, beam expander, and Nd:YAG...view
  • Telecentric Lenses

    Telecentric Lenses

    February 17, 2017In many machine-vision systems, such as those used in semiconductor inspection, precise repeatable measurements must be made consistently. To ensure this occurs, system developers must turn to more ex...view